Optical Inspection System Generates 75 Million 3D Data Points per Second

Cyberoptics will unveil its new Multi-Reflection Suppression™ (MRS) enabled 3D and 2D WX3000 Metrology and Inspection systems for wafer-level and advanced packaging applications at the upcoming virtual SEMICON West show.Incorporating the NanoResolution MRS sensor, the WX3000 Metrology and …