Multisensor CMM System Measures Microscopic Part Features

Multisensor CMM System Measures Microscopic Part Features

Multisensor CMM System Measures Microscopic Part Features

Mitutoyo’s MiSCAN allies coordinate measuring machine (CMM) and vision measurement machine (VMM) technologies to enable scanning measurement of the smallest component features using the newly developed MPP‑NANO micro‑form probe. The aim of this system design is to enable the most accurate …