Micrometer

Triple Scan Enables Nanometer, Micrometer, and Millimeter Measurements

Triple Scan Enables Nanometer, Micrometer, and Millimeter Measurements

Keyence has announced that it has added white light interferometry to its 3D Surface Profiler VK-X3000 Series providing capabilities to measure from nanometers to millimeters. Highly accurate measurement of any target is now possible through the use of three different measurement principles namely …