Large Area 3D Optical Metrology System Launched

Sensofar Metrology has announce the release of a new metrology tool for wide areas. The Sensofar S wide is a high-performance non-contact 3D optical large area metrology system designed for micro-scale measurement, with advanced inspection and analysis capabilities.

S wide is a dedicated solution designed to rapidly measure large sample areas up to 300 x 300 mm (11.8 x 11.8 in) and provides all the benefits of a digital microscope integrated into a high-resolution measuring instrument. Extremely easy-to-use with one button data acquisition.

The Sensofar S wide is ideal for all lab environments, without limitations and as a metrology sensor in production areas. S wide is manufactured to deliver accurate and traceable measurements. Systems are calibrated and traceable according to the ISO 25178 and VDI2634-2 standards.

S wide comes with SensoSCAN software which drives the system with a clear, intuitive and user-friendly interface and is coupled with new software SensoVIEW for a broad range of analysis tasks. Automated analysis modules have been created to make all QC procedures easier with SensoPRO. The most significant product features are:

• One shot height measurement up to 40 mm without Z-scanning
• Sub-micron height repeatability over entire extended area
• Form deviation from 3D CAD models
• Bi-telecentric lenses with very low field distortion providing accurate metrology

For more information: www.sensofar.com