The TAP2500, TAP3500 and TAP4000 Single-ended Active FET probes provide excellent high-speed electrical and mechanical performance required for today’s digital system designs.

Outstanding electrical performance

• High probe bandwidth
• Fast probe rise time
• Excellent signal fidelity
• ≤0.8 pF input capacitance
• 40 kΩ input resistance
• -4 V to +4 V input dynamic range
• -10 V to +10 V DC input offset range
• ±30 V (DC + peak AC) Maximum input voltage (nondestructive)

Versatile mechanical performance

• Small compact probe head for probing small geometry circuit elements
• DUT attachment accessories enable connection to SMDs as small as 0.5 mm pitch
• Robust design for reliability

Easy to use

• Connects directly to oscilloscopes with the TekVPI™ probe interface
• Provides automatic units scaling and readout on the oscilloscope display
• Easy access to oscilloscope probe menu display for probe status/diagnostic information and to control probe DC offset
• Remote GPIB/USB probe control through the oscilloscope

Applications

• Verification, debug, and characterization of high-speed designs
• Signal integrity, jitter, and timing analysis
• Manufacturing engineering and test
• Signals with voltage swings up to 8 V p-p